Panel 1: “What will Artificial Intelligence bring? Discussing the advent and consequences of superhuman intelligence.”
February 1st 2018, 6:00PM
Open to public
Reception will follow
Freeman Auditorium Woldenberg Art Center
7018-7098 Plum St, New Orleans, LA 70118
As AI is becoming more pervasive in our life, its impact on society is more significant and concerns and issues are raised regarding aspects such as value alignment, data handling and bias, regulations, and workforce displacement. Recognizing the importance of providing scientifically sound and reliable information on this topic, the AAAI/ACM Conference on Artificial Intelligence, Ethics and Society will open its program with a panel open to the public. World class researchers from different disciplines and best selling authors will elaborate on the impact of AI on modern society and will answer questions from the public.
Moderator: Brent Venable, Tulane University
- Paula Boddington (Oxford University)
- Jason Furman (Harvard University)
- Peter Stone (UT Austin)
- Wendell Wallach (Yale University)
Panel 2: Prioritizing Ethical Considerations in Intelligent and Autonomous Systems – Who Sets the Standards?
Feb.2nd, 2018 from 5:30-6:30pm
Traditionally, product engineering standards have focused squarely on issues of technological interoperability and safety. While considerations along these lines can be extremely complex, standards have not overtly tackled applied ethical issues directly when being created.
Today, however, organizations like The British Standards Institute (BSI) with their BS 8611: Robots and robotic devices: Guide to the ethical design and application of robots and robotic systems Standard, and IEEE's P7000 suite of thirteen standardization projects are creating a new paradigm in the field.
While dealing with intelligent and autonomous technologies, these standards and standardization projects are also providing detailed guidelines or requirements to help organizations institute new levels of transparency, accountability and traceability that can build trust and maximize innovation while avoiding negative unintended consequences.
Moderator: John Havens, IEEE
- Takashi Egawa (NEC Corporation)
- Simson L. Garfinkel (USACM)
- John C. Havens (IEEE)
- Dan Palmer (The British Standards Institution)
- Annette Reilly (IEEE)